This UoS offers the fundamental knowledge that is essential for the microscopy and microanalysis of materials. The UoS will cover the basic fundamental concepts of materials structures and modern materials characterisation techniques that are available in the University, including X-ray diffraction, scanning electron microscopy, transmission electron microscopy, atom probe tomography, atomic force microscopy, and X-ray photoelectron spectroscopy.
Lectures, Tutorials, Laboratories
Refer to the assessment table in the unit outline.
AMME1362 or AMME9302 or CIVL2110.