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This UoS offers the fundamental knowledge that is essential for the microscopy and microanalysis of materials. The UoS will cover the basic fundamental concepts of materials structures and modern materials characterisation techniques that are available in Sydney Microscopy and Microanalysis in the University, including X-ray diffraction, scanning electron microscopy, transmission electron microscopy, and atom probe tomography.
| Study level | Postgraduate |
|---|---|
| Academic unit | Aerospace, Mechanical and Mechatronic |
| Credit points | 6 |
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Prerequisites:
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None |
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Corequisites:
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None |
| Prohibitions:
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MECH5311 |
| Assumed knowledge:
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None |
The learning outcomes for this unit will be available two weeks before the first day of teaching.
This section lists the session, attendance modes and locations the unit is available in. There is a unit outline for each of the unit availabilities, which gives you information about the unit including assessment details and a schedule of weekly activities.
The outline is published 2 weeks before the first day of teaching. You can look at previous outlines for a guide to the details of a unit.
| Session | MoA ? | Location | Outline ? |
|---|---|---|---|
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Semester 1 2026
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Normal day | Camperdown/Darlington, Sydney |
Outline unavailable
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Find your current year census dates
This refers to the Mode of attendance (MoA) for the unit as it appears when you’re selecting your units in Sydney Student. Find more information about modes of attendance on our website.