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We are aiming for an incremental return to campus in accordance with guidelines provided by NSW Health and the Australian Government. Until this time, learning activities and assessments will be planned and scheduled for online delivery where possible, and unit-specific details about face-to-face teaching will be provided on Canvas as the opportunities for face-to-face learning become clear.

We are currently working to resolve an issue where some unit outline links are unavailable. If the link to your unit outline does not appear below, please use the link in your Canvas site. If no link is available on your Canvas site, please contact your unit coordinator.

Unit of study_

MECH5311: Microscopy and Microanalysis of Materials

This UoS offers the fundamental knowledge that is essential for the microscopy and microanalysis of materials. The UoS will cover the basic fundamental concepts of materials structures and modern materials characterisation techniques that are available in the University, including X-ray diffraction, scanning electron microscopy, transmission electron microscopy, atom probe tomography, atomic force microscopy, and X-ray photoelectron spectroscopy.

Code MECH5311
Academic unit Aerospace, Mechanical and Mechatronic
Credit points 6
Prerequisites:
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None
Corequisites:
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None
Prohibitions:
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None
Assumed knowledge:
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AMME1362 or AMME9302 or CIVL2110.

At the completion of this unit, you should be able to:

  • LO1. communicate effectively the microstructures, crystalline structures and crystalline defects of materials in oral and/or written presentations
  • LO2. describe, in relatively simple terms, crystalline lattice structures in reciprocal space, describing theoretically, schematically, and mathematically
  • LO3. communicate effectively several common microstructural characterisation techniques in oral and/or written presentations
  • LO4. describe, in relatively simple terms, the interactions of fast electrons with matter, describing theoretically, schematically, and mathematically
  • LO5. identify crystalline phases using X-ray diffraction and determine crystalline lattice structures using electron diffraction
  • LO6. understand common materials preparation techniques for structural characterisation
  • LO7. understand the basic working mechanism of the scanning electron microscope and microstructural information that can be extracted from electron backscattered images and secondary electron images
  • LO8. understand the basic working mechanism of electron backscatter diffraction and its applications in structural characterisation of materials
  • LO9. understand the basic working mechanisms of the transmission electron microscope, including electron diffraction, imaging and spectrometry, and their applications in materials characterisation
  • LO10. understand the basic working mechanisms of several scanning probe microscopy techniques and their applications in materials research
  • LO11. understand the basic working mechanism of X-ray photoelectron spectroscopy and its applications in materials research

Unit outlines

Unit outlines will be available 2 weeks before the first day of teaching for 1000-level and 5000-level units, or one week before the first day of teaching for all other units.

There are no unit outlines available online for previous years.