This UoS offers the fundamental knowledge that is essential for the microscopy and microanalysis of materials. The UoS will cover the basic fundamental concepts of materials structures and modern materials characterisation techniques that are available in Sydney Microscopy and Microanalysis in the University, including X-ray diffraction, scanning electron microscopy, transmission electron microscopy, and atom probe tomography.
Unit details and rules
|Aerospace, Mechanical and Mechatronic
AMME1362 or AMME2302 or AMME9302 or CIVL2110
|Available to study abroad and exchange students
|Xiaozhou Liao, email@example.com