This bespoke JPK NanoWizard V BioAFM with Hybrid stage, coupled to an integrated widefield and Ax-R advanced confocal microscope, combines high spatio-temporal resolution in nano-mechanical imaging with advanced imaging capabilities.

NanoWizard V bioScience AFM with Hybrid stage features:

• Nanomechanical mapping and characterisation of single molecules, cells, tissues, and highly delicate samples - the leading BioAFM for mechanobiology applications.
• AFM head designed with automatic laser alignment and adjustment for easy set up.
• Fully compatible with optical microscopy (confocal, widefield, fluorescence, DIC).
• Includes a PetriDIsh Heater and access to CO2 for long-term live cell studies.
• Tip-Scanning technology with a range of 100 x 100 x 15 µm3 for easy operation in air, gases, and liquids.
• The Hybrid stage includes an additional scanner with a range of 100 x 100 x 100 µm3. The system can overlay the optical microscopy image with AFM information, and the hybrid stage enables scanning in the mm range through tiling.
• Ability to study dynamic biological processes in real time via adaptive, intelligence-based scanning routines (up to 400 lines/sec), fast force mapping and molecular recognition.
• SPM V8 software for state-of-the-art analysis and batch processing routines.
•  PeakForce-QI, the symbiosis of PeakForce Tapping and QI modes, delivers fast, controlled, and flexible nanomechanical measurements.
• Applications of the instrument include correlative AFM and optical microscopy, cell and tissue nanomechanics, cell adhesion studies (single-cell spectroscopy), and magnetic force microscopy (MFM).

Nikon Ax-R advanced confocal microscope features:

• Nikon Ax-R confocal system with Ti2 inverted microscope and camera for superior optical performance.
• System includes both a high-resolution scanner (8k x 8k) and a high-speed scanner (2k x 2k), with 4 lasers (405 nm, 488 nm, 651 nm, and 640 nm).
• System can also operate in widefield microscopy and incorporates a Sola V-nIR light module and an ORCA-Fusion BT Digital CMOS camera.

The JPK NanoWizard ULTRA Speed 3 is a premier high speed imaging AFM platform that provides up to 1,400 lines/second on suitable samples, high resolution imaging of biological and other soft samples in air or liquid, precise force spectroscopy, and nanomechanical force mapping.

NanoWizard ULTRA Speed 3 features:

• High-speed imaging AFM that acquires up to 1,400 lines per second.
• Scanner range is 30 x 30 x 8 um3 and the instrument can operate in air and liquids.
• The system includes a motorised sample stage and a top view optical microscope for sample inspection.
• System enables acquisition of topography and mechanical properties for bio-samples including single molecules and viruses.
• PeakForce Tapping® for easy nanomechanical imaging and direct force control at ultra-low forces preventing damage to your samples and probes.
• New tiling functionality for automated mapping of large sample areas.
• SPM V8 software.
• State-of-the-art position sensor delivers the highest accuracy and maximum precision while imaging.

The Asylum Research Jupiter XR Atomic Force Microscope is the only AFM to combine high-speed imaging, extended-range scanning and full 200mm sample access in one platform. It delivers unmatched versatility for advanced materials research at nanoscale to mesoscale levels. Features include:

• Extended-range scanner (100 µm XY, 12 µm Z) that operates 5-20 times faster than conventional systems.
• blueDrive™ Tapping Mode for stable, high-speed operation. Achieve ≥20Hz line rates for dynamic studies.
• Combines sharp top-view optics for precise targeting with a high-speed stage for instant 200 mm sample navigation and magnetic/vacuum wafer holding.
• Fully motorized laser/detector alignment with SpotOn™ one-click precision alignment.
• Removable Z scanner for easy probe changes.
• Ergo Software provides effortless operation with minimal training and features automated site-to-site measurements and Autopilot™  for intelligent scan optimisation.

Jupiter XR operational modes:

• Basic: Contact mode; Force curves; Lateral force mode; Nanolithography and nanomanipulation; Phase imaging; Tapping mode (AC mode).
• Nanomechanical: AM-FM Viscoelastic Mapping Mode; Force mapping mode; Loss tangent imaging.
• Nanoelectrical, Functional & Electromechanical: Electric force microscopy (EFM); Kelvin probe force microscopy (KPFM); Conductive AFM (CAFM) with ORCA™; Magnetic force microscopy (MFM); Dual AC Resonance Tracking (DART) piezoresponse force microscopy (PFM); Switching spectroscopy PFM; Vector PFM.
• Accessories: Liquid cell, Sample cooler-heater.